SEE/MAPLD is Modernizing! In recognition of the evolution of complex microelectronics for space usage, this event will now be known as the:
featuring the Systems-on-a-Chip (SoCs) for Space Workshop!
(SEE Symposium featuring SoCs for Space Workshop)
May 11 – 15, 2026
Marriott La Jolla
San Diego, California
While Field Programmable Gate Arrays (FPGAs) have not gone away, we recognize that many FPGAs are SOCs and the trade space with other architecture SOCs is growing in the space regime.
The 2026 SEE Symposium featuring SOCs for Space Workshop
Will be held, May 11-15, 2026 at the Marriott Hotel in La Jolla, CA. The 2025 Symposia attracted nearly 200 professionals from Industry, Government and Academia. In addition to hosting 24 Exhibits, the event featured more than 30 technical talks, a poster session and a full day tutorial dedicated to SEE testing of FPGAs. Attendees represent fields of space radiation environment and radiation effects as well as those developing and using SOCs or SOC-based systems in space (e.g., FPGAs, GPU/TPUs, memories, power devices, communications, etc).
SEE/SoCS 2026 will include an interactive, full day tutorial on best practices for gathering and analyzing FPGA/SoC SEE data for risk-informed decision making, entitled, “Did I make the Right Decision?”. The workshop will also feature a special topic on Data Centers in Space and more than 20 exhibitors.
Areas of Focus
SEE/SoCS will feature content including, but not limited to, the following:
Single Event Effects
- Latest and greatest SEE test data
- SEE Test Facilities (High Energy Heavy Ion, Heavy Ion, proton, neutron, …)
- Pulsed Lasers
- New models, tools, simulations and suites (design and analysis)
- Test methods, best practices, guidelines, and standards
- SEE Assurance and Mission Systems
- Hardening / mitigation at system level
- Fault propagation
- Alternate SEE Test Platforms
- In-orbit data
- Training and workforce development
- Data Sharing and Communication Platforms
- SEE Space Environments
- Special session on Wide Bandgap power devices and testing
- Alternate SEE Assurance methods
Systems-on-a-Chip
- SoCs, FPGAs, GPUs, TPUs, Neuromorphic processors
- AI/ML, neural nets
- SoC design, verification, and validation tools and methods
- Standards, guidelines and best practices
- Applications and optimization
- Radiation performance
- Security
- Flight experience
- 2.5/3D packaging
- Reliability, Assurance and test challenges
Contact Us
Justin Likar, JHU/APL, General Chair
Ian Troxel, Troxel Aerospace Industries, Inc., SoCS Chair
George Tzintzarov, The Aerospace Corporation, SEE Technical Chair
Codie Mishler, Northrop Grumman, Tutorial Chair
Martha O’Bryan, TSS, Poster Session Chair
Larisa Milic, EMPC, Exhibits Chair
Teresa Farris, Archon, LLC, Meeting Planner
Carl Szabo, CS Enterprises, A/V Chair