Monday, 11 May 2026
Time (PST)	Duration	Session	Title	Speaker	Organization
11:00	08:30	Workshop Registration 11:00 - 19:30
13:00	00:10	Intro	Opening Remarks	Justin Likar George Tzintzarov	JHU/APL The Aerospace Corporation
13:10	00:10	New Effects and Efforts	Session Intro	Sergeh Vartanian	Relativity Space
13:20	00:20		SEE Test Methodology for Systematic Upscreening of COTS Devices	Stephen Martinez	TRAD, Inc.
13:40	00:20		SEHE Effects 7nm and 4nm AI SoCs	Douglas Sheldon	Jet Propulsion Laboratory
14:00	00:20		Effects of Electrical Program/Erase Cycling on the Single-Event Response of 65 nm SONOS Charge-Trap	Adam Hubbard	Indiana University
14:20	00:20		RadSim: A Lightweight Framework for Simulation of Single-Event Upsets in Arbitrarily Complex ICs	John Barney	Indiana University
14:40	00:20		CARRE: The Center for Advancing the Radiation Resilience of Electronics	James Trippe	Vanderbilt University
15:00	00:30	Break
15:30	00:40	Invited	Invited Talk Single Event Effects in the Starlink Mega-Constellation: On-Orbit Observations from 10,000 Satellites	Henry Tokar	SpaceX
16:10	00:10	Testing Techniques	Session Intro	Adalin Benedetto	Alphacore
16:20	00:20		Predicting the Location of Heavy Ion Interactions within Analog Components	Jake Carpenter	Indiana University
16:40	00:20		Benchtop Emulation of System-Level Analog Single-Event Transients from Piece-Part Data	Matthew McKinney	Indiana University
17:00	00:20		Fully Automated Shutter Testing (FAST) for Single-Event Effects (SEE)	Evan Agarwal	Amentum/JSC
17:20	00:20	Break
17:40	01:50	Welcome Reception and Registration (Soledad Ballroom)
19:30		End of Monday Events
Tuesday, 12 May 2026
Time (PST)	Duration	Session	Title	Speaker	Organization
07:30	08:30	Workshop Registration 07:30 - 16:00 Breakfast 07:00 - 08:30
08:10	00:10	Facilities	Session Intro	Scott Davis	The Aerospace Corporation
08:20	00:20		The K150 Cyclotron Upgrade and Cyclotron Institute Building Expansion Projects at TAMU	Henry Clark	Texas A&M University
08:40	00:20		High-Energy Heavy Ion Testing in HEARTS@CERN: possibilities and challenges	Natalia Emriskova	CERN
09:00	00:20		RADNEXT 2030 EU-program: Europe’s coordinated access to radiation effects testing facilities	Gerd Datzmann	Datzmann Interact & Innovate
09:20	00:20		Development and Start-up of the K500 SEE Test Facility at MSU	Steve Lidia	Michigan State University
09:40	00:20		Unofficial Domestic U.S. Heavy Ion Capacity and Demand	Kenneth LaBel	Trusted Strategic Solutions, LLC
10:00	00:30	Break
10:30	00:20	Facilities	The Importance of ECR Ion Sources for Heavy Ion Accelerators	Janilee Benitez	Lawrence Berkeley National Laboratory
10:50	00:20		Space Electronics Testing at BNL: a Status Report	Kevin Brown	Brookhaven National Laboratory
11:10	00:20		The Constraint Surface of Proton Radiation Effects Testing: One Year of Operational Usage Patterns	Eric O'Quinn	ProNova Solutions
11:30	01:30	Lunch
13:00	00:10	Alternative SEE Testing	Session Intro	Dale McMorrow	U.S. Naval Research Laboratory
13:10	00:20		STELLARBeam	Jason Thieman	Northrop Grumman Corporation
13:30	00:20		High-energy x-ray source for alternative SEE tests	Stephen Coleman	RadiaSoft
13:50	00:20		Progress on Pulsed Electrons as an Alternative to Heavy-Ion SEE Testing	Atharva Kulkarni	UCLA Particle Beam Physics Lab
14:10	00:20		Verifying Surrogate Sources for Single-Event Effects Testing	Joel Hales	U.S. Naval Research Laboratory
14:30	00:20		Northrop Grumman’s PULSEE Lab Upgrades and Recent Results	Jeffrey Warner	Northrop Grumman Corporation
14:50	00:20		Characterizing the Operating Parameters for Pulsed Laser SEE Testing	Trevor Crane	U.S. Naval Research Laboratory
15:10	00:20	Break
15:30	00:40	Invited	Invited Talk Cause and Effect: Using on orbit anomalies to improve space weather knowledge, monitoring, and resilience	Janet Green	The Aerospace Corporation
16:10	00:50	Panel Discussion: AI for Accelerators Moderator: Krysten Pfau, Lockheed Martin Panelists: Janilee Benitez, Lawrence Berkeley National Laboratory Steve Lidia, Michigan State University Kevin Brown, Brookhaven National Laboratory Henry Clark, Texas A&M University
17:00		End of Tuesday Events
Wednesday, 13 May 2026
Time (PST)	Duration	Session	Title	Speaker	Organization
07:30	08:30	Workshop Registration 07:30 - 16:00 Breakfast 07:00 - 08:30
08:10	00:10	Wide Bandgap Semiconductors	Session Intro	Sajal Islam	Indiana University
08:20	00:40	Invited	Invited Talk Basic mechanisms of single-event effects in wide-bandgap power devices: an overview of SiC and GaN technologies	Corinna Martinella	University of Montpellier
09:00	00:20	Wide Bandgap Semiconductors	SEE Testing of Latest Generation Rad Hard Low Voltage GaN HEMTs	Rob Strittmatter	EPC Space
09:20	00:20		SEE test results of various generation of GaN HEMT	Mauricio Cano	Infineon
09:40	00:20		Pulsed-Laser Single-Event Effects Study of Wide-Bandgap and Ultrawide Bandgap Semiconductors	Ani Khachatrian	U.S. Naval Research Laboratory
10:00	00:30	Break
10:30	00:20	Wide Bandgap Semiconductors	Geometry- and Power-Rating-Dependent Heavy-Ion Induced Single-Event Effects in Enhancement-Mode GaN	Herb Gingold	University of Central Florida (Radiation Effects Exploration Lab)
10:50	00:10	Community Efforts	Session Intro	Mitra Yoonessi	General Atomics
11:00	00:20		Modernizing Radiation Effects Community Infrastructure	Kenneth LaBel	Trusted Strategic Solutions, LLC
11:20	00:20		Tech Demos & Rapid Prototyping: Best Practices and Approaches for Proton SEE at System Level	Justin Likar	Johns Hopkins University Applied Physics Laboratory
11:40	01:30	Lunch
13:10	00:20	Community Efforts	RAD-TECH: A Research Portfolio to Enable State-of-the-Art Electronics in Radiation Environments	John Dickinson	Sandia National Laboratory
13:30	00:20	Community Efforts	Developing Radiation Effects Talent Through Air Force Research Laboratory and University of New Mexico Collaboration	Ben Rutherford	COSMIAC
13:50	00:10	SoCS	SoCS Intro	Ian Troxel	Troxel Aerospace Industries
14:00	00:40	Invited	Invited Talk Functional Safety Beyond the Road: Lessons from Autonomous SoC Evolution	Jyotika Athavale	Waymo
14:40	00:20	SoCS	Radiation Effects on Versal Network-on-Chip (NoC)	Matthew Cannon	Sandia National Laboratory
15:00	00:30	Break
15:30	00:20	SoCS	Mitigating Multi-Bit Error in FPGA BRAM with least hardware overhead	Kamesh Ramani	Siemens EDA
15:50	00:20		A Cross-Layer Framework to Evaluate and Improve Radiation Tolerance of AI Workloads on FPGA SoCs	Emre Salman	Stony Brook University
16:10	00:20		Closing the Verification Gap: AI-Powered Requirement Verification for FPGA Designs	Adam Taylor	Adiuvo Engineering & Training, Ltd.
16:30	01:00	End of Technical Sessions - 1 Hour Break
17:30	02:30	Industrial Reception
20:00		End of Wednesday Events
Thursday, 14 May 2026
Time (PST)	Duration	Session	Title	Speaker	Organization
07:30	08:30	Workshop Registration 07:30 - 16:00 Breakfast 07:00 - 08:30
08:20	00:40	SoCS	Invited Talk Put a SoC In It! System on Chip Adoption Trends in Space Systems	Ian Troxel	Troxel Aerospace Industries
09:00	00:20	SoCS	Evaluating the Edge: SEE and TID Assessment of the NVIDIA Jetson AGX Thor	Michael Felix	UNM COSMIAC/AFRL
09:20	00:20		Radiation Testing AI/ML at the SPACER Laboratory	Francisco Viramontes	UNM COSMIAC/AFRL
09:40	00:20		Single Event Effects characterization of Frontgrade Gaisler's GR716B radiation-hardened microcontroller	Brian Baranski / Lucas Tambara	Frontgrade Gaisler
10:00	00:30	Break
10:30	00:20	SoCS	i.MX 8 SoC as an ISS space radiation monitor data logger	Krzysztof Sielewicz	SigmaLabs Sp. z o.o.
10:50	00:20		Fault tolerance on PIC64-HPSC and Moog’s Cascade SBC	Mark Broadbent	Moog, Inc.
11:10	00:20		SESHAT: A Spacecraft Cryptographic Service Plane on ARM+FPGA SoCs	Mohamed El-Hadedy	California State Polytechnic University, Pomona
11:30	00:20		Angular Single-Event Upsets in Heavy Ion Irradiation	David Lee	Sandia National Laboratory
11:50	01:30	Lunch
13:20	00:40	Invited	Invited Talk Do Androids Dream of Martian Skies? Turning a COTS Snapdragon 801 SoC into a Reliable Compute Co-Processor for the Perseverance Rover	Harry Wang	Jet Propulsion Laboratory
14:00	00:10	Tutorial	Tutorial Introduction: Did I make the right choice? Click here for more details about the tutorial modules	Codie Mishler	Northrop Grumman Corporation
14:10	01:15	Tutorial	Tutorial Module 1 Why We Test for Single Event Effects (SEEs)? With Emphasis on Systems on a Chip (SoCs) and Field Programmable Gate Arrays (FPGAs)	Ken LaBel	Trusted Strategic Solutions, LLC
15:25	00:20	Break
15:45	01:15	Tutorial	Tutorial Module 2 Calculating uncertainty in upset rates	Dave Hansen	L3 Harris
17:00	00:30	Break
17:30	02:30	Poster	Poster Session & Career Networking Happy Hour - Soledad Ballroom
			SEE Testing at the UCLA PEGASUS Facility	Atharva Kulkarni	UCLA Particle Beam Physics Lab
			SEE Test Results on Telemetry Manager LX7730	Jackson Heun	Microchip
			Single-Event Burnout Mitigation in Beta Ga2O3ƒ Schottky Barrier Diodes Using Field-Plated Metal Ring	Joyprokash Debnath	University of Central Florida
			Radiation Performance Validation of the MAG-PLL00002: Enabling Precision Timing for Next-Generation Space Missions	Anton Quiroz	Magics
			Single-Event Effects Testing of the ISL75055SLH, ISL73846SLH, and the ISL74324M	Cole Thomson	Renesas
			FULTRA – the new radiation hardened by design 3D PLUS FPGA based processing platform	Patrice Benard	3D Plus USA
			Altera FPGAs for Mission-Critical Applications: Readiness, Evaluation, and Adoption	Andres Perez Celis	Altera
20:00		End of Thurday Events
Friday, 15 May 2026
Time (PST)	Duration	Session	Title	Speaker	Organization
07:00	04:00	Workshop Registration 07:00 - 11:00 Breakfast 07:00 - 08:30
07:45	01:15	Tutorial	Tutorial Module 3 Seeing the unseeable: experimental visibility of complex systems	Seth Roffe	Shift5
09:00	01:15	Tutorial	Tutorial Module 4 SEE response of SoCs and matching observations to underlying SEEs	Steve Guertin	Jet Propulsion Laboratory
10:15	00:15	Break
10:30	01:15	Tutorial	Tutorial Module 5 Better sets of SEE SoC-FPGA data: a checklist approach for test plans and reports	Kenneth LaBel	Trusted Strategic Solutions, LLC
11:45	00:10	Tutorial	Wrap up	Codie Mishler	Northrop Grumman Corporation
11:55	00:05		Conference Wrap Up	Justin Likar	Johns Hopkins University Applied Physics Laboratory
12:00		End of Workshop